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Combined roughness- and contour measurement
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Point of Contact
International Sales Support
Phone: +49 7720 602-0
Fax: +49 7720 602-123
HOMMEL-ETAMIC nanoscan 855
Roughness and contour measurement with maximum precision
The nanoscan 855 uses an extremely advanced technologically innovative opto-mechanical measuring system.
Tactile workpiece scanning is transmitted to an optical scale by a high-precision mechanical pick-up which is then interpreted by a laser interferometer. This innovative design makes the nanoscan 855 the measuring system of choice for high precision applications.
Tactile workpiece scanning is transmitted to an optical scale by a high-precision mechanical pick-up which is then interpreted by a laser interferometer. This innovative design makes the nanoscan 855 the measuring system of choice for high precision applications.
Maximum performance in simultaneous measurement of roughness and contour
Technologically innovative
• Electronic probe arm detection The probe arms are detected electronically and
automatically assigned to each measuring task. This eliminates measuring errors
due to incorrect probe arms.
• Electronic stylus tip protection device (patent pending) Damage to the stylus tip
is eliminated using an electronic speed limiter to prevent abrupt contact with the
workpiece.
• Electronic probe force setting Probe force can be electronically adjusted,
depending on the stylus tip, to avoid measuring errors or stylus tip damage.
• High-precision probe arm positioning For small bore measurements or automatic
measurement of surfaces with interruptions.
New evaluation possibilities
• Combined roughness and contour evaluation: Roughness and contour are
measured simultaneously and displayed as one evaluation. Due to the large
measuring stroke and the top/bottom scanning of the workpiece, the nano scan
855 is an extremely flexible system.
• Top and bottom measurement: Complex measurements requiring scanning in
both directions, and instances where multiple single traces are required, can all
be accomplished with a single measuring routine using probe arms with a double
stylus tip. This extends the range of applications to measurements of inside
diameters as well as the evaluation of parallelism and angularity of geometric
elements from several profi les.
• Topography measurement with large stroke: Topography measurements
requiring a large measur ing stroke and high resolution can be completed with an
optional Y-axis.
Technologically innovative
• Electronic probe arm detection The probe arms are detected electronically and
automatically assigned to each measuring task. This eliminates measuring errors
due to incorrect probe arms.
• Electronic stylus tip protection device (patent pending) Damage to the stylus tip
is eliminated using an electronic speed limiter to prevent abrupt contact with the
workpiece.
• Electronic probe force setting Probe force can be electronically adjusted,
depending on the stylus tip, to avoid measuring errors or stylus tip damage.
• High-precision probe arm positioning For small bore measurements or automatic
measurement of surfaces with interruptions.
New evaluation possibilities
• Combined roughness and contour evaluation: Roughness and contour are
measured simultaneously and displayed as one evaluation. Due to the large
measuring stroke and the top/bottom scanning of the workpiece, the nano scan
855 is an extremely flexible system.
• Top and bottom measurement: Complex measurements requiring scanning in
both directions, and instances where multiple single traces are required, can all
be accomplished with a single measuring routine using probe arms with a double
stylus tip. This extends the range of applications to measurements of inside
diameters as well as the evaluation of parallelism and angularity of geometric
elements from several profi les.
• Topography measurement with large stroke: Topography measurements
requiring a large measur ing stroke and high resolution can be completed with an
optional Y-axis.