HOMMEL-ETAMIC T8000 RC120 digiscan

Roughness and contour measurement, intelligently combined

Depending on the measuring task, the roughness probe can be assigned to the drive bar or under the traverse unit and can be used along the entire traverse length of 120 mm.

The new "digiscan" contour probe systems deliver more. The intelligent probe arms equipped with "chip in arm" technology facilitate operation and protect the contour probe tips against damage. The digital measuring system delivers a consistently high level of measuring accuracy across the entire measuring range of 60 mm, and as a result masters all measuring tasks.

Measuring that is accurate and automatic:
The intelligent probe arm sets the probe arm configuration, measuring force and probing direction automatically and assigns these to the measuring program. The new, high-performance EVOVIS software is the optimum solution for the integrated evaluation of roughness and contour characteristics.

The contour measurement feature can also be configured to measure upwards or downwards, as required. As a result, the range of applications is extended, e.g. to include measuring internal diameters and evaluating parallelisms or angularities on multiple profiles. The measuring range can also be extended from 60 mm to 90 mm as required.

HOMMEL-ETAMIC T8000 RC120 digiscan at a glance:

Optimally configured measuring station for combined roughness and contour measurement
Measures roughness and waviness over 120 mm
Easy-to-exchange probe arms with "chip in arm" technology and magnetic probe arm holder
Electronically regulated probing prevents damage to the probe tips
Simple, reliable calibration process
Can be optionally expanded to include upward/downward measuring functionality and a 90 mm vertical measuring range
Latest generation of the easy-to-operate EVOVIS software, with extensive evaluation and reporting functions

Shipment

T8000 RC120 digiscan, Art. 1005 0332

Evaluation computer with 22" TFT flat-screen display, color printer and CD burner
EVOVIS evaluation software for roughness and contours
wavelift measuring column with motorized height adjustment and travel speed of 0.1–12 mm/s, trace width of 400 mm
waveline 120 advanced traverse unit with incremental linear measuring system and
0.1-µm resolution; traverse length of 120 mm; straightness accuracy of < 0.4 µm/120 mm
Tilting device for traverse unit with swivel range ± 45°/± 5°
Granite plate with 10-mm T groove: 780 x 500 mm
TKU probe set including 4 probe rods
FHZ probe holder
RNDH2 roughness standard with Ra approx. 1 µm and Rz approx. 3 µm
wavecontour digiscan contour probe including TD-60 probe arm with carbide tip;
measuring range of 60 mm; digital measuring system, resolution of 0.05 µm; magnetic probe arm holder; automatic probe arm detection; electronic probing force setting
Precision measurement ball and holder
MT1 measuring table for holding the workpieces