Topography Evaluation: Option for Roughness Measurement
The Waveline Map 3D analysis software allows you to capture specific profile and surface data on your workpieces — in addition to the roughness measurement.
The Waveline measuring systems from Jenoptik can be used for roughness or contour measurement. We also offer systems that combine both of these functions. The Waveline T8000, Surfscan and Nanoscan Jenoptik measuring systems can be expanded with 3D analysis software for topography. The Waveline Map software allows you to render the surface texture of workpieces as a graphic for evaluation.
Waveline Map is intuitively designed and is easy to operate. Measured data, for example, can be pre-processed with respect to alignment, filtering and form removal. Automatic recalculations are performed as soon as the evaluation steps change. The system provides extensive metrological and scientific filtering options.
The 3D analysis software is available in three versions: Basic, Expert and Premium. The Expert and Premium versions meet the ISO/TS 25178 standard for 3D parameters.
In addition to software, a Y positioning table is also required for topography measurements. This facilitates the necessary workpiece movement. The tables can hold components of up to 30kg in weight, and work with a guide accuracy of approximately 5μm.
- Flexible: Can be used at measuring stations for roughness measurement where necessary
- Simple: Intuitive software is easy to use
- Fast: Automatic recalculations after changes to evaluation steps
- Modular: Three versions that build on each other
- Automotive industry: Measurement of 3D parameters on workpiece surfaces
- Research and development: Tribological studies to optimize surface functions
Hommel Map Basic
- Document management
- Interactive studies of 3D objects
- 2D parameters pursuant to DIN EN ISO 4287
- Distance measurement, step height evaluation
Additional functions to basic version:
- Evaluation of profile series
- Rk parameters, motif parameters
- 2D parameters for automotive applications
- 3D parameters
- Joining of multiple profiles
- FFT analysis, frequency spectrum and autocorrelation
- Morphological filtering on 3D objects
- Difference between two surfaces
Hommel Map Premium
Additional functions to expert version:
- Extensive studies of surface series
- Studies on binary surfaces (grains)
- Multilayer surfaces
3D Parameters According to EN ISO 25178
International standard EN ISO 25178 specifies the parameters and measuring methods for evaluating three-dimensional surfaces. These specifications expand the range of options available for describing surfaces, enabling characteristics such as structure and functionality to be included, for example.
Vertical amplitude parameters use individual values to specify the vertical structure of the surface and are based on the 2D profile section evaluation. These parameters are transferred from the linear 2D evaluation to the areal 3D evaluation. However, it is not possible to carry out a reliable evaluation of the functional behavior of a surface using these parameters.
Sa – areal arithmetic mean roughness
Sk – areal core roughness depth
Sz – areal average peak-to-valley height
Sq – areal quadratic arithmetic mean deviation
Spatial parameters specify the structural pattern of the surface. The ACF autocorrelation function is used for this purpose.
Sal – autocorrelation length
Str – texture-aspect-ratio
Hybrid parameters combine vertical and spatial parameters in order to determine the gradient.
Sdq – average quadratic surface gradient
Sdr – ratio of the actual surface to the measurement surface
Vertical, spatial and hybrid parameters specify a surface in general terms. In order to determine the functional properties of a surface, function-oriented parameters are used, at the core of which is the areal material ratio curve (corresponds to the material ratio curve in 2D metrology).
Smr – areal material ratio curve
Sk – core roughness (specifies the load capacity of the core area surface)
Spk – reduced peak height
Svk – reduced valley depth
Vm – material ratio
Vv – clean volume per unit area
Structural parameters were introduced to specify individual surface structures. These parameters are based on orographic techniques (earth science, which deals with topographical structure) that view surfaces as a landscape in which the flow of water is observed.