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„Just the right PIC – How advanced test concepts enable fast PIC wafer-level tests!”

Photonics Integrated Circuits, so-called PICs, include multiple photonic and electronic functions in one single chip and enable faster and more efficient devices. To ensure the functional integrity and performance of the final products, testing the PICs already at wafer or die level is key. Hence, testing still remains a challenge, especially in high-volume wafer production. But there is some light at the end of the tunnel.

Join our webinar to learn how optical and electrical functions of PICs can be tested efficiently, about the challenges of testing at wafer level and how advanced test solutions lead to higher overall yields. Find out:

  • what the challenges of PIC testing are, especially at wafer level
  • how standardization can guide the way to HVM testing
  • why functional tests of PIC are so important, especially at wafer level
  • how testing optical and photonic functions in parallel can make your wafer production more cost effective
  • how to eliminate the need for active alignment on a chip-by-chip basis.

Hurry up – Time to register

Guest Speaker

Dr. Sylwester Latkowski, Scientific Director at the Photonic Integration Technology Center, Eindhoven University of Technology (TU/e)

  • He works in the Department of Electrical Engineering and is a member of the Photonic Integration Group at TU/e. He will share with us his expertise on PIC testing at wafer level.

Speaker

Tobias Gnausch, Product Manager in Jenoptik's Semiconductor & Advanced Manufacturing business

  • He will present the novel test concept of the opto-electronic UFO Probe® Card as a solution for advanced high-throughput PIC testing.

One session, two time slots – just choose one in your preferred time zone!

Local Time:
-
13 March 2024
-
CET
Just the right PIC – How advanced test concepts enable fast PIC wafer-level tests
Speaker: Tobias Gnausch; Product Manager at Jenoptik for UFO Probe ®Card | Guest speaker: Sylwester Latkowski, Eindhoven University of Technology (TU/e)
Local Time:
-
13 March 2024
-
CET
Just the right PIC – How advanced test concepts enable fast PIC wafer-level tests
Speaker: Tobias Gnausch, Jenoptik Product Manager for the UFO Probe® Card | Guest speaker: Sylwester Latkowski, Eindhoven University of Technology (TU/e)

Get a taste of it

Good to have full knowledge of your known-good-dies in an early stage of the wafer production process. Foundries and test houses need to test thousands of PICs a day in a time-saving manner. Not an easy task, considering that there is no standardized way yet to test comparable to the methods developed the IC ecosystem and used for decades.

In the Jenoptik talk, we will discuss a possibility to achieve this goal. Imagine you could test optical and electrical functionalities of Photonic Integrated Circuits (PICs) with just one probe card! And this one is running on existing standard IC wafer probers and IC test equipment. This is possible with Jenoptik´s UFO Probe® Card. Whether it is a cantilever or vertical version, it combines proven needle technology with a novel optical concept, that needs no active alignment.

Time-saving parallel testing

wafer prober

Works with IC test equipment

Multi-DUT or multi-chip testing

Can't make it?

Interested but no chance to make it that day? Just register anyway and receive the video and slides.

Any questions on the webinar? Please contact:

Contact

Manja Baechstaedt-Henning

Product MarCom Manager Semiconductor & Advanced Manufacturing

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